John F. Wager

John Wager

Professor
School of Electrical Engineering & Computer Science
Oregon State University
 
Michael and Judith Gaulke Endowed Chair
School of Electrical Engineering & Computer Science
Oregon State University
 

Education

B.S., Engineering Physics, Oregon State University, 1977
M.S., Electrical Engineering, Colorado State University, 1978
Ph.D., Electrical Engineering, Colorado State University, 1981
 

Honors and Awards

Loyd Carter Award for Outstanding and Inspirational Teaching, 1989
Alumni Professor Award for Outstanding Scholarly Contributions, 1996
OSU College of Engineering Research Award for Outstanding and Sustained Research Leadership, 2000
OSU Sigma Xi Researcher of the Year, 2006
College of Engineering Research Collaboration Award, 2007
Society for Information Display Special Recognition Award "For his pioneering contributions to the development
   of oxide TFTs," 2012
IEEE Fellow “For contributions to the development of transparent electronics,” 2012 
 

Research Interests

Transparent electronics, oxide electronics, metal-insulator tunneling electronics, amorphous metal thin films, and thin-film photovoltaics.
 

CSMC Research Thrusts

Dielectrics and Semiconductors 
Early Transition Metal Clusters & Films
 

Recent Center Publications

  1. Wager, J. F. and Yeh, B. “Oxide Thin-Film Transistors: Device Physics,” in Bengt G. Svensson, Stephen J. Pearton, and Chennupati Jagadish; editors: Semiconductors, Semiconductors and Semimetals, Vol. 88, 2013, Burlington: Academic Press, 283-315.
  2. Wager, J. F.; Yeh, B.; Hoffman, R. L.; Keszler, D. A., An amorphous oxide semiconductor thin-film transistor route to oxide electronics. Current Opinion in Solid State and Materials Science 2013.
    http://dx.doi.org/10.1016/j.cossms.2013.07.002
  3. Cowell, E. W.; Knutson, C. C.; Kuhta, N. A.; Stickle, W.; Keszler, D. A.; Wager, J. F., Engineering anisotropic dielectric response through amorphous laminate structures. Physica Status Solidi a-Applications and Materials Science 2012, 209, 777-784.
    http://dx.doi.org/10.1002/pssa.201127616
  4. Wager, J. F.; Hoshino, K.; Sundholm, E. S.; Presley, R. E.; Ravichandran, R.; Knutson, C. C.; Keszler, D. A.; Hoffman, R. L.; Mourey, D. A.; Robertson, J., A framework for assessing amorphous oxide semiconductor thin-film transistor passivation. Journal of the Society for Information Display 2012, 20, 589-595. [This paper was awarded the best paper of 2012 for the Journal of Information Display.]
    http://dx.doi.org/10.1002/jsid.120

Recent Press

  1. Society for Information Display 2013 Keynote Address Interview, May 2013
  2. Exciting Developments in Oxide TFT Technology, June 2013
  3. Thin. Fast, Flexible Semiconductors, IEEE Spectrum, April 2011

CV (download)
 

Contact

P: (541) 737 2994 
F: (541) 737 1300
 

Learn more at the School of EECS

 
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